Surfmera Axis Foundation

The Surfmera AXIS platform forms the universal core of the modern nanolab, engineered to deliver unbeaten flexibility and professional grade performance for the most demanding scanning probe research.

KEY FEATURES

  • Unparalleled Flexibility: open design and easy sample access for limitless research possibilities;
  • Modes: 50 + Standard AFM modes and powerful software to customize your research;
  • Scalable Platform: straightforward expansion to AFM-Raman-TERS or AFM-nano-IR;
  • Versatile Environments: vacuum, controlled atmosphere or fluid environments with ease;
  • Quantitative Insights: precise quantitative nano-mechanical measurements and artifact-free scanning.

APPLICATIONS AND MODES

Material science

  • Nanostructures and 2D materials;
  • Polymers and soft materials;
  • Thin films and coatings;
  • Energy materials;
  • Semiconductors;
  • Metamaterials.

Electromagnetic Characterization

  • KPFM: Maps surface potentials with 3mV sensitivity and 20nm resolution;
  • EFM: Probes nanoscale charge distributions;
  • PFM: Characterizes electromechanical properties;
  • C-AFM: Maps local current distribution with pA sensitivity;
  • MFM: Reveals configuration of magnetic domains.

Life Science Applications

  • Multi-environment imaging: Air and liquid environments, precise temperature control;
  • Quantitative nanomechanical analysis: Cell elasticity, adhesion forces, and more;
  • Diverse applications: Single-molecule biophysics, live-cell dynamics, microbial interactions.
Surfmera Axis Foundation

TECHNICAL CHARACTERISTICS

Scan typeby sample, by probe, both
Sample sizeup to 100 mm diameter, up to 15 mm height
XYZ scan range (CL)100x100x10 μm
Non linearity≤ 0.15%
Optical resolution at 10х3 μm (1 μm, 0,4 μm with optional objectives)
External variable magnetic field generatorsin-planeup to 2000 Gauss
out-of-planeup to 500 Gauss
Options
Heating stagesup to 300 °C
Low vacuumdown to 10-3 Torr
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