Surfmera LUMINA unlocks a new level of synergistic analysis, where deeply integrated AFM and Raman capabilities work in concert to automatically correlate nanoscale structure with chemical composition, providing a holistic view unattainable with separate instruments.
KEY FEATURES
- Comprehensive Nanoscale Analysis: fusion of high-end AFM, confocal Raman, TERS and SNOM for sub-10 nm chemical, structural and mechanical mapping;
- In-situ Environment Control: AFM-Raman in air, liquids, controlled atmospheres and variable temperatures;
- Modular & Open: up to five interchangeable lasers and top-bottom-side illumination to suite any application;
- Automated Workflows: intuitive software streamlines data acquisition and analyses – making high-throughput, routine procedures effortless.
APPLICATIONS AND MODES
Nanoscale Analysis
- Combines AFM topography with Raman spectral mapping;
- Reveals defect distributions, strain effects, and interlayer interactions;
- High spatial resolution;
- for graphene, TMDs, and van der Waals heterostructures.
Unified Correlative Microscopy
Seamlessly overlays nanoscale topography from AFM with chemical fingerprinting from Raman spectroscopy in a single point. This eliminates the uncertainty of correlating data from separate instruments, providing definitive structure-property relationships.
Polymer and Composite Investigation
- Comprehensive characterization of multiphase materials;
- AFM mechanical property mapping + Raman chemical identification;
- Insights into phase separation, filler distribution, and interfacial properties.
Optical Device Characterization
- Nanoscale structural-optical correlation for photonic devices;
- Combines AFM topography with Raman spectroscopy;
- Studies semiconductor lasers, optical fibers, and plasmonic components.
TERS: Tip Enhanced Raman Scattering
- Sub-diffraction chemical imaging;
- Modular illumination paths for plasmonic resonance optimization;
- Real-time feedback for stable signal acquisition and polarization control.
Technical Charachteristics
| Scanning Probe Microscopy | |
| OBD alignment | Fully automated OBD alignment (AFM optical beam deflection system) |
| OBD lasers | Interchangeable lasers (670 / 830 / 1300 nm) — avoid interference with Raman |
| Probe compatibility | STM tips |
| AFM cantilevers | |
| Quartz tuning forks (tapping/shear force modes) | |
| Optical Configuration | |
| Illumination geometries | Top / Bottom / Side illumination |
| High-NA objectives | 100× 1.45 NA (inverted) |
| 100× 0.7 NA (upright/side) | |
| 50× 0.55 NA (upright/side) | |
| Wide-field objectives | 10× 0.28 NA |
| 20× 0.40 NA | |
| Objective changer | Easy-to-change |
| <2 μm repeatability | |
| Beam steering mirrors | Precise laser positioning |
| Hotspot tracking | |
| Fast optical mapping | |
| Spectrometer interface | Universal, compatible with commercial and custom spectrometers |
| Spectroscopic Capabilities | |
| 520 mm FD spectrometer | 4 automated gratings |
| Up to 0.1 cm⁻¹ resolution | |
| Multi-laser excitation | Up to 5 sources |
| 405–1050 nm | |
| Instant switching | |
| Detection options | TE / water-cooled CCD / EMCCD; APD / PMT; FLIM |
| Extended spectral range | Low-frequency Raman <10 cm⁻¹ |
| Full SNOM detection | |
| Correlative Microscopy | |
| Simultaneous AFM + confocal | Raman imaging |
| Fluorescence imaging | |
| Rayleigh scattering | |
| AFM-based autofocus | |
| Optical resolution | 200 nm lateral |
| 500 nm axial | |
| Optical controls | Automated pinhole |
| Variable ND filter 0.1–100% | |
| Motorized beam conditioning | |
| Single-click presets | |
| 3D imaging | XYZ confocal scanning |
| Comprehensive analysis tools | |